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Kenneth J. Braakman is a doctoral researcher in the department of Total Quality Operations at NXP Semiconductors and in the department of Industrial Engineering and Innovation Sciences at the Eindhoven University of Technology. He obtained his master鈥檚 degree in Operations Management & Logistics at the Eindhoven University of Technology cum laude. His primary research interest is in the area of modeling, controlling and optimizing high-tech manufacturing systems with a focus on data-driven quality control in the semiconductor industry.